Software Features 
• Menu Based Software for control of spectrometer functions and data analysis
• Application templates
• Simple Flow Bar Wizard to create new methods
• Profile Fitting Software for qualitative and quantitative analysis
• Matching library for augmentation of Fundamental Parameters
• Automatic spectral overlap deconvolution
• Empirical Calibration with overlap and matrix compensation

Specifications 
Conforms to the specifications of:
ASTM D4294, D5059, D7220, ISO 20847, ISO 8754, IP 496, IP 336, JIS K 2541-1
Excitation: 
50 kV X-Ray Tube with Pd Anode
50W Maximum Power
4 Standard Polarization and Secondary Targets depending on application, for optimum excitation
Optional Fifth Target for Optimal Excitation of Na and Mg
Detection: 
High Performance Silicon Drift Semiconductor Detector
Peltier Electronic Cooling
Optimum Balance of spectral resolution and high count rate
Detection Limits (LLD):
Sulfur: 0.54 ppm
Chlorine: 0.3 ppm
Lead: 0.0002 g/L
Nickel and Vanadium: 1 ppm
Iron: 2 pp,
Sample Chamber: 
Large 38cm dia. X 10cm deep sample chamber for bulk samples
15-Position Automatic Sample Changer (32mm Sample Cups)
Analysis in Air, Helium Purge, or Vacuum Available
User Interface (Computer):
External PC Computer System including:
Microsoft Windows Vista Operating System
Keyboard and Mouse, Monitor
Printer
Environmental Conditions:
Ambient Temperatures 18 - 28°C (65 - 82°F)
Relative Humidity < 75% 
Vibration undetectable by human
Free from corrosive gas, dust, and particles
Electrical Requirements:
100/240V, 1.4A, 50/60Hz
Single Phase AC

Dimensions wxdxh,in.(cm)
23.6 x 23.6 x 15.7 (60 x 60 x 40)
Net Weight: 127 lbs (80 kg)